T5000

TFT Parameter Test System

#Mobility #Vth #On/Off Ratio #S-Ratio


· TFT Device or OTFT Device

· Transfer Characteristic Curve

· Output Characteristic Curve

· Lifetime Evaluation and Aging Test

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T5000 performs a large variety of Carrier Mobility experiments for the Thin-Film Transistor (TFT) with using user preferred parameters. You can get consistent and precise measurement data, directly analyze your results in the measurement software and speed up your research.

TFT Device or OTFT Device

Transfer Characteristic Curve

Output Characteristic Curve

Lifetime Evaluation and Aging Test

System Configuration

System Components

Dual Sourcemeter/Parameter Analyzer

Multichannel Voltage/LED Current Source

Test Jig/ThermoStation/Switching Unit

ProbeStation/TFT Parameter Test Software

System Specification

Model NameT5000 Thin-Film Transistor Parameter Test System
System Model/OptionSGX : Single channel, MTX : Multi channel / S : Standard Model, T : Thermal Stress Model, C : Light Stress Model
System ConfigurationParameter Analyzer, Multichannel Voltage Source, Multichannel LED Current Source, Switching Unit, Sample Mounting Unit,
Thermostation, Probestation, Microscope & Monitor
DimensionSize(mm3) : 1,000 x 1,000 x 1,000 / Weight(kg) : <200kg / Utility : 220V, 15A
SampleThin Film Transistor(TFT), Oxide TFT, Organic TFT
Sample SizeGlass Size : <50mm x 50mm
Contact TypePogo Pin Type(Typical), Probe Tip(Probestation)
Mobility Measure Range<500cm2/V.sec
Current Measure Accuracy<10-12A
Temperature Control RangeR.T. ~ 100℃, Air Cooling
LED Light Control CurrentMax. 500mA, 3W High Power White LED
Measure/Analysis ItemField Effect Mobility, Saturation Mobility, On/Off Ratio, Threshold Voltage, Sub-Treshold Swing Slope

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