T5000

TFT Parameter Test System

#Mobility #Vth #On/Off Ratio #S-Ratio


· TFT Device or OTFT Device

· Transfer Characteristic Curve

· Output Characteristic Curve

· Lifetime Evaluation and Aging Test

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T5000 performs a large variety of Carrier Mobility experiments for the Thin-Film Transistor (TFT) with using user preferred parameters. You can get consistent and precise measurement data, directly analyze your results in the measurement software and speed up your research.

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TFT Device or OTFT Device

Transfer Characteristic Curve

Output Characteristic Curve

Lifetime Evaluation and Aging Test

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System Configuration

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System Components

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Dual Sourcemeter/Parameter Analyzer

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Multichannel Voltage/LED Current Source

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Test Jig/ThermoStation/Switching Unit

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ProbeStation/TFT Parameter Test Software

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System Specification

Model NameT5000 Thin-Film Transistor Parameter Test System
System Model/OptionSGX : Single channel, MTX : Multi channel / S : Standard Model, T : Thermal Stress Model, C : Light Stress Model
System ConfigurationParameter Analyzer, Multichannel Voltage Source, Multichannel LED Current Source, Switching Unit, Sample Mounting Unit,
Thermostation, Probestation, Microscope & Monitor
DimensionSize(mm3) : 1,000 x 1,000 x 1,000 / Weight(kg) : <200kg / Utility : 220V, 15A
SampleThin Film Transistor(TFT), Oxide TFT, Organic TFT
Sample SizeGlass Size : <50mm x 50mm
Contact TypePogo Pin Type(Typical), Probe Tip(Probestation)
Mobility Measure Range<500cm2/V.sec
Current Measure Accuracy<10-12A
Temperature Control RangeR.T. ~ 100℃, Air Cooling
LED Light Control CurrentMax. 500mA, 3W High Power White LED
Measure/Analysis ItemField Effect Mobility, Saturation Mobility, On/Off Ratio, Threshold Voltage, Sub-Treshold Swing Slope
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