T5000 performs a large variety of Carrier Mobility experiments for the Thin-Film Transistor (TFT) with using user preferred parameters. You can get consistent and precise measurement data, directly analyze your results in the measurement software and speed up your research.

TFT Device or OTFT Device
Transfer Characteristic Curve
Output Characteristic Curve
Lifetime Evaluation and Aging Test

System Configuration


System Components

Dual Sourcemeter/Parameter Analyzer

Multichannel Voltage/LED Current Source

Test Jig/ThermoStation/Switching Unit

ProbeStation/TFT Parameter Test Software

System Specification
| Model Name | T5000 Thin-Film Transistor Parameter Test System |
| System Model/Option | SGX : Single channel, MTX : Multi channel / S : Standard Model, T : Thermal Stress Model, C : Light Stress Model |
| System Configuration | Parameter Analyzer, Multichannel Voltage Source, Multichannel LED Current Source, Switching Unit, Sample Mounting Unit, Thermostation, Probestation, Microscope & Monitor |
| Dimension | Size(mm3) : 1,000 x 1,000 x 1,000 / Weight(kg) : <200kg / Utility : 220V, 15A |
| Sample | Thin Film Transistor(TFT), Oxide TFT, Organic TFT |
| Sample Size | Glass Size : <50mm x 50mm |
| Contact Type | Pogo Pin Type(Typical), Probe Tip(Probestation) |
| Mobility Measure Range | <500cm2/V.sec |
| Current Measure Accuracy | <10-12A |
| Temperature Control Range | R.T. ~ 100℃, Air Cooling |
| LED Light Control Current | Max. 500mA, 3W High Power White LED |
| Measure/Analysis Item | Field Effect Mobility, Saturation Mobility, On/Off Ratio, Threshold Voltage, Sub-Treshold Swing Slope |

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