T3000 PLUS
Time of Flight Measurement System
#Mobility #TOF #DIT #CELIV
· Charge Carrier Transport in Organic Semiconductor
· Measurement of Electron/Hole Mobility
· Time of Flight Measurement (TOF)
· Dark Injection Transient (DIT)
· Charge Extraction by Linearly Increasing Voltage (CELIV)
· Low Temperature Measurement
Related products
The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.
Charge Carrier Transport in Organic Semiconductor
Measurement of Electron/Hole Mobility
Time of Flight Measurement (TOF)
Dark Injection Transient (DIT)
Charge Extraction by Linearly Increasing Voltage (CELIV)
Low Temperature Measurement
System Configuration
System Components
Nd-YAG Laser/Trigger Unit
Oscilloscope/V-Source/Function Generator/Test Jig
Cryostat/Optical Unit
TOF Measurement Software
System Specification
| Model Name | T3000 PLUS Time of Flight Measurement System |
| System Option | S : Standard Option / T : Low Temperature Option / C : Dark Injection & CELIV Function Option |
| System Configuration | Laser(Nd-YAG), Oscilloscope, High Voltage Sourcemeter, Signal Amplifier, Loader & Trigger Unit, Optical Unit(Focusing Lens, Beam Splitter, Photodetector, Sample Mounting Unit, Dark Box & System Frame, (Option) Dye Laser, Probe Unit, Low Temperature Unit(Cryostat, Temperature Controller, Vacuum Accessories) |
| Dimension | Size(mm) : 2,400 x 800 x 1,600 / Weight(kg) : <200kg / Utility : 220V, 15A, 99.999% N2 Gas |
| Sample | Organic Materials (Electron, Hole) |
| Sample Size / Type | Glass Size : <50mm x 50mm / Active Area : >2mm x 2mm / Top and Bottom Type |
| Beam Size | <2mm x 2mm |
| Measure Time Range | 4nsec ~ 10s/div |
| Transit Time Min. Measure Time | Min. 1usec |
| Mobility Measure Range | >10-6 cm2/V.sec @ 1um Sample Thickness |
| Measure/Analysis Item | Transit Time, Mobility, Zero Mobility, E-Field vs Mobility, Temperature vs Mobility |
OLED & Display | Solar Cell & Photovoltaics | Battery & Electrochemical System | Flexible Electronics & Organic Semiconductor | LED & Optical System
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