M6600
OLED I-V-L Reliability Test System
#OLED #Lifetime #I-V Scan #Multi-Channel #Luminance/CIE #Recipe/Sequence/Eigen Plot
· Relative Lifetime Test
· Relative I-V-L Test
· Aging Test
· Multi Current / Photocurrent Range
· Sequence Operation with multiple Recipe
· Acceleration Test using Thermal Chamber
Related products
All Optimized for Multi-Channel I-V-L Test
The test system provides various parameters for OLED reliability evaluation by the periodic I-V-L measurement while driving OLED devices. McScience brand of multichannel I-V-L unit applies electrical power to multiple devices of OLED TEG, and measures excited light emission using the photodiode. The I-V-L (PD current) characteristic curve is obtained from current and PD current corresponding voltage scan by the multichannel I-V-L unit, which is configured to provide individual channel’s analysis of relative I-V-L change data for lifetime change through a combination of recipes or sequences.
Relative Lifetime Test
Relative I-V-L Test
Aging Test
Multi Current / Photocurrent Range
Sequence Operation with mutiple Recipe
Acceleration Test using Thermal Chamber
System Configuration
System Components
Multi-Channel IVL Tester
Test Jig & JIG Frame
ThermoStation/Chamber/UPS
OLED I-V-L Reliability Test Software
System Specification
Product Name | M6600 OLED I-V-L Reliability Test System | |
Function | Lifetime Test, Aging Test, IVL Test | |
Capacity | 32ch / Unit | |
Output Mode | CV, CC, CL, PV, PC, PCV | |
Voltage | Range | ±20V |
Accuracy | ±0.05% + 10mV (F.S.R.) | |
Current | Range | [Range 1] ±1mA / [Range 2] ±10mA (Auto 2-Range Shunt Type) |
Accuracy | [Range 1] ±0.05% + 1uA (F.S.R.) / [Range 2] ±0.05% + 10uA (F.S.R.) | |
Photocurrent | Range | [Range 1] 0uA~10uA / [Range 2] 0uA~100uA / [Range 3] 0uA~1mA (Auto) |
Accuracy | [Range 1] ±0.05% + 5nA (F.S.R.) / [Range 2] ±0.05% + 10nA (F.S.R.) / [Range 3] ±0.05% + 50nA (F.S.R.) | |
Pulse | Frequency Range | 10 ~ 256Hz / 1Hz Step |
Duty | 1 ~ 99% / 1% Step | |
Measurement Item | Time, Voltage, Current, Photo-Current, Luminance, CIE | |
Data Backup | Automatic Data Backup in HW Memory in case of SW Disconnection | |
Interface | LAN |
OLED & Display | Solar Cell & Photovoltaics | Battery & Electrochemical System | Flexible Electronics & Organic Semiconductor | LED & Optical System
B-1102, Digital Empire Bldg. 1556-16 Deogyeong Blvd., Yeongtong, Suwon, 16690, Korea
(T) +82-31-303-5789 (F) +82-31-303-5787 (E) sales@mcscience.com (H) www.mcscience.com