All Optimized for Multi-Channel I-V-L Test

The test system provides various parameters for OLED reliability evaluation by the periodic I-V-L measurement while driving OLED devices. McScience brand of multichannel I-V-L unit applies electrical power to multiple devices of OLED TEG, and measures excited light emission using the photodiode. The I-V-L (PD current) characteristic curve is obtained from current and PD current corresponding voltage scan by the multichannel I-V-L unit, which is configured to provide individual channel’s analysis of relative I-V-L change data for lifetime change through a combination of recipes or sequences.