Technology


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( We are constantly updating)

Core Technology

Software Recipe

M Series

OLED & Display System

Light On

Light Off

I-V-L OneShot

I-V-L Sweep

CIE Color Analysis

EL Efficiency

CRI

View Angle

Capacitance Voltage

CapacitanceFrequency

Lifetime

Aging

Image Sticking

Flicker

Transient Response

K Series

Solar Cell & Photovoltaics

Irradiance

Uniformity

I-V Oneshot

I-V Sweep Continuum

I-V Sweep Flash

Quantum Efficiency

Long-term Reliability

EL Imaging

PL Imaging

Vision Inspection

High Potential

Ground Bond

Image Sticking

Flicker

Transient Response

Q Series

Battery & Electrochemical System

Charge

Discharge

Charge & Discharge

Open Circuit Voltage

Rest

Pattern Charge & Discharge

Transient Response

Frequency Response

DC Resistance

AC Resistance

Cycle

C-rate

State of Charge

C-rate

Transient Response

T Series

Flexible Electronics & Organic Semiconductor

Time of Flight

Transient Photocurrent Response

Transient Photovoltage Response

Charge Extraction

Charge Extraction By Linearly Increasing Voltage

Capacitance Voltage

Capacitance Frequency

Intensity Modulated Photocurrent Spectroscopy

Intensity Modulated Photovoltage Spectroscopy

Vision Inspection

High Potential

Ground Bond

Image Sticking

Flicker

Transient Response

Common

Temperature

Statistics

Transient Photovoltage Response

Charge Extraction

Charge Extraction By Linearly Increasing Voltage

Capacitance Voltage

Capacitance Frequency

Intensity Modulated Photocurrent Spectroscopy

Intensity Modulated Photovoltage Spectroscopy

Vision Inspection

High Potential

Ground Bond

Image Sticking

Flicker

Transient Response

I-V-L One Shot

OLED & Display System – M Recipe


Item

Description

Name

I-V-L One Shot

Outline

Measurement of lighting intensity and efficiency every one point by applying Voltage or Current bias to OLED device

Metadata

Variable characteristics test by measuring one point such as Luminance, X, Y, Z, CIE 1931 (x, y), CIE 1960 (u, v), CIE 1976 (u’, v’), duv, Current Density, Luminous Efficiency, Power Efficiency, Quantum Efficiency, Voltage, Current, Spectrum, CCT, CRI, FWHM and etc.

Eigen Plot(Example)

1) Spectrum

2) CIE 1931 (x, y)

I-V-L Sweep

OLED & Display System – M Recipe


Item

Description

Name

I-V-L Sweep

Outline

Measurement of material’s characterization in accordance with lighting intensity and efficiency by applying Voltage or Current bias to OLED device

Metadata

Variable characteristic tests as a function of Luminance, X, Y, Z, CIE 1931 (x, y), CIE 1960 (u, v), CIE 1976 (u’, v’), duv, Current Density, Luminous Efficiency, Power Efficiency, Quantum Efficiency, Voltage, Current, Spectrum, CCT, CRI, FWHM and etc.

Eigen Plot(Example)

1) V-L Curve

2) I-V Curve