T3000 Time of Flight Measurement System
The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.
#Mobility #TOF #DIT #CELIV
T3000 PLUS Time of Flight Measurement System(Laser/LED)
The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.
#Mobility #TOF #DIT #CELIV
T4000 Organic Semiconductor Parameter Test System
The optoelectronic characterization of organic semiconductor layer is substantially important in applications for organic photovoltaics(OPV) and organic light emitting diode (OLED), and T4000 Organic Semiconductor Parameter Test System performs various experiments based on LED light source and high-speed measurement electronics in order to obtain carrier lifetime, carrier mobility, diffusion coefficient and other characteristic parameters.
#TPV/TPC/CE #CELIV #T-EL #I-V #EIS #IMPS/IMVS
T5000 TFT Parameter Test System
T5000 performs a large variety of Carrier Mobility experiments for the Thin-Film Transistor (TFT) with using user preferred parameters. You can get consistent and precise measurement data, directly analyze your results in the measurement software and speed up your research.
#Mobility #Vth #On/Off Ratio #S-Ratio
OLED & Display | Solar Cell & Photovoltaics | Battery & Electrochemical System | Flexible Electronics & Organic Semiconductor | LED & Optical System
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