ㆍIndependent Multi-Channel Power Driving and Measurement (CC, CV, CL, PC, PV, PCV)
ㆍLuminance Measurement using Photodiode or Color Sensor
ㆍAccelerated Lifetime Test under Temperature Condition
ㆍPeriodic I-V-L Measurement during Lifetime Test
ㆍSpectrum, CIE Index, CCT, CRI
ㆍCurrent Efficiency, Power Efficiency, Quantum Efficiency
ㆍViewing Angle Test
ㆍMechanical Deformation Test (Bending, Rolling, Torsion)
ㆍTransient Electroluminescence Measurement
ㆍFrequency Response Analysis (Nyquist Plot, Bode Plot)
ㆍCapacitance Voltage Measurement (C-V Plot, C-F Plot)
ㆍDisplay Uniformity Inspection using Area Colorimeter
ㆍPixel Uniformity Inspection using Microscope and Spectroradiometer
M6000 PIXX Imaging & Lifetime Test System periodically measures the electroluminescence image while driving display devices such as OLED, QLED, Micro and Mini LED, and evaluates the variation of luminance, structural deformation and uniformity through the device life cycle, in addition to the conventional display device lifetime tests including voltage and current measurement.
#Multi-Channel #Imaging #Uniformity #Lifetime #Auto-Focusing #V(λ) Filter
M6000 PLUS OLED Lifetime Test System is used to test the capability of OLED materials to withstand the continuous electrical source or environmental changes between high/low temperature, and therefore understands the chemical changes or physical damages caused by degradation in the designated time. It is applicable to OLED unit cell, module, panel. The lifetime test result can be used as a reference or basis for OLED material improvement and better quality.
#OLED #Lifetime #I-V Scan #Multi-Channel #Luminance/CIE #Recipe/Sequence/Eigen Plot
The M6000 OLED Lifetime Test System provides multi-channel testing frame in which power driving for OLED lighting is possible in various control mode, and emitted light intensity and color information can be collected by each photodiode combined to each OLED test sample. Depending on the type of photodiode employed, the measure could be an absolute luminance, or a CIE color index, or just a photocurrent value from the photodiode. The system has three sub-models based on power driving methods, PMX for unit cell device and PMOLED panel, AMX for AMOLED panel, and MDX for OLED module with driver IC.
#OLED #Lifetime #Multi-Channel #Photo-Diode #Constant/Pulse Source #Temperature Acceleration Test
The M6100 OLED I-V-L Test System performs I-V-L test using source-meter for electrical control and measurement, and optical detector such as colorimeter or spectroradiometer for luminance and color measurements under dark cabinet environment. Measurement of luminance and chromaticity allows calculation of luminous and power efficiency.Measurement of emission spectra allows calculation of quantum efficiency and CRI index, as additionally important OLED characteristics.
#I-V #EL #Efficiency #Color/Spectrum #CRI #View angle(WAD)
M6200 OLED Transient EL/PL Test System is designed to measure transient response characteristics of OLED device such as transient electroluminescence, time resolved photoluminescence. As excitation source, transient EL test system uses the electrical pulse generator, while time resolved PL test system uses the high speed pulse laser. It is useful tool to study charge carrier dynamics such as charge mobility, response time and carrier lifetime.
#OLED #Transient Electroluminescence #Time Resolved Photoluminescence
The M7000 Auto I-V-L Test System is for multi-channel testing of display devices with a common optical detector such as spectroradiometer or colorimeter which changes its measurement position automatically by 3-axis positioner. Test items cover wide range of display testing standards, not only the basic display device characteristics, but also their long-term variation upon time including lifetime measurement. The system has three sub-models based on power driving methods, PMX for unit cell device and PMOLED panel, AMX for AMOLED panel, and MDX for OLED module with driver IC.
#Multi-Channel #Automation #I-V-L #Spectrum #Color #Lifetime
M7500 In-Line I-V-L Test System is an automated system which measures Current-Voltage-Luminance characteristics of display device. It is composed of an in-line automatic control system that holds multiple samples at once and discharges them after electrical and optical measurements, making it convenient in measuring multiple samples. It can be applied to various types of samples through design changes of jig pallet, and a MES function that supports smart factory construction can also be used.
#In-Line #Multi-Channel #Sequence #PLC #I-V-L
M3000 OLED Parameter Test System consisting of McScience’s brand-new LUMO Imaging SpectroRadiometer and OLED Parameter Tester, the technical combination of which analyzes the electrical & optical properties such as I-V-L, C-V, Viewing Angle, Color Coordinates, Spectrum, Luminance Imaging and Uniformity. This equipment designed for a high-precision and high-accuracy measurement is suitable for various researches associated with display performance and characterization for OLED, QLED, Micro and Mini LED.
#OLED #I-V-L #C-V #View Angle #Lifetime # Spectrum # Luminance #Color #Image #Uniformity
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