System M-OLED & Display – Mcscience Inc.

ㆍIndependent Multi-Channel Power Driving and Measurement (CC, CV, CL, PC, PV, PCV)

ㆍLuminance Measurement using Photodiode or Color Sensor

ㆍAccelerated Lifetime Test under Temperature Condition

ㆍPeriodic I-V-L Measurement during Lifetime Test

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ㆍCurrent-Voltage-Luminance Characteristics

ㆍSpectrum, CIE Index, CCT, CRI

ㆍCurrent Efficiency, Power Efficiency, Quantum Efficiency

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ㆍViewing Angle Test

ㆍTemperature Test

ㆍMechanical Deformation Test (Bending, Rolling, Torsion)

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ㆍTransient Electroluminescence Measurement

ㆍPhotoluminescence Measurement

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ㆍFrequency Response Analysis (Nyquist Plot, Bode Plot)

ㆍCapacitance Voltage Measurement (C-V Plot, C-F Plot)

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ㆍDisplay Uniformity Inspection using Area Colorimeter

ㆍPixel Uniformity Inspection using Microscope and Spectroradiometer

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M6000 PIXX Imaging & Lifetime Test System

M6000 PIXX Imaging & Lifetime Test System periodically measures the electroluminescence image while driving display devices such as OLED, QLED, Micro and Mini LED, and evaluates the variation of luminance, structural deformation and uniformity through the device life cycle, in addition to the conventional display device lifetime tests including voltage and current measurement.

#Multi-Channel #Imaging #Uniformity #Lifetime #Auto-Focusing #V(λ) Filter

M6000 PLUS OLED Lifetime Test System

All Optimized for Multi-channel Power Driving Lighting and Measurement of OLED Lifetime

M6000 PLUS OLED Lifetime Test System is used to test the capability of OLED materials to withstand the continuous electrical source or environmental changes between high/low temperature, and therefore understands the chemical changes or physical damages caused by degradation in the designated time. It is applicable to OLED unit cell, module, panel. The lifetime test result can be used as a reference or basis for OLED material improvement and better quality.

#OLED #Lifetime #I-V Scan #Multi-Channel #Luminance/CIE #Recipe/Sequence/Eigen Plot

M6100 OLED I-V-L Test System

Standard OLED I-V-L Test System

The M6100 OLED I-V-L Test System performs I-V-L test using source-meter for electrical control and measurement, and optical detector such as colorimeter or spectroradiometer for luminance and color measurements under dark cabinet environment. Measurement of luminance and chromaticity allows calculation of luminous and power efficiency.Measurement of emission spectra allows calculation of quantum efficiency and CRI index, as additionally important OLED characteristics.

#I-V #EL #Efficiency #Color/Spectrum #CRI #View angle(WAD)

M6200 OLED Transient EL/PL Test System

High Accuracy and Enhanced Performance for Transient Response Measurement of OLED

M6200 OLED Transient EL/PL Test System is designed to measure transient response characteristics of OLED device such as transient electroluminescence, time resolved photoluminescence. As excitation source, transient EL test system uses the electrical pulse generator, while time resolved PL test system uses the high speed pulse laser. It is useful tool to study charge carrier dynamics such as charge mobility, response time and carrier lifetime.

#OLED #Transient Electroluminescence #Time Resolved Photoluminescence

M6400 OLED Impedance Test System

Electrical characteristics of the sample can be analyzed through impedance measurement analysis. This device is designed to increase user convenience by automatically measuring multiple samples in sequence and to acquire reliable data while measuring multiple samples in a short period of time. This device can analyze the resistance elements constituting the sample through C-F measurement while sweeping the frequency at a fixed bias voltage, or measure charge injection and mobility through C-V measurement while sweeping the bias voltage at a fixed frequency. In addition, by adding ThermoStation as an option, users can designate independent temperature conditions and cycles for each sample to analyze characteristics under various temperature conditions.

#Charge Injection #Mobility #Resistance #Capacitance #CF #CV #CFV #CVF

M6600 OLED I-V-L Reliability Test System

All Optimized for Multi-Channel I-V-L Test

The test system provides various parameters for OLED reliability evaluation by the periodic I-V-L measurement while driving OLED devices. McScience brand of multichannel I-V-L unit applies electrical power to multiple devices of OLED TEG, and measures excited light emission using the photodiode. The I-V-L (PD current) characteristic curve is obtained from current and PD current corresponding voltage scan by the multichannel I-V-L unit, which is configured to provide individual channel’s analysis of relative I-V-L change data for lifetime change through a combination of recipes or sequences.

#OLED #Lifetime #I-V Scan #Multi-Channel #Luminance/CIE #Recipe/Sequence/Eigen Plot

M7000 Auto I-V-L Test System

Automatic Test of Various Optical Characteristics of Display Devices

The M7000 Auto I-V-L Test System is for multi-channel testing of display devices with a common optical detector such as spectroradiometer or colorimeter which changes its measurement position automatically by 3-axis positioner. Test items cover wide range of display testing standards, not only the basic display device characteristics, but also their long-term variation upon time including lifetime measurement. The system has three sub-models based on power driving methods, PMX for unit cell device and PMOLED panel, AMX for AMOLED panel, and MDX for OLED module with driver IC.

#Multi-Channel #Automation #I-V-L #Spectrum #Color #Lifetime

M7500 In-Line I-V-L Test System

Automatic Test System of Various Characteristics of OLED/Display Unit Devices

M7500 In-Line I-V-L Test System is an automated system which measures Current-Voltage-Luminance characteristics of display device. It is composed of an in-line automatic control system that holds multiple samples at once and discharges them after electrical and optical measurements, making it convenient in measuring multiple samples. It can be applied to various types of samples through design changes of jig pallet, and a MES function that supports smart factory construction can also be used.

#In-Line #Multi-Channel #Sequence #PLC #I-V-L

M3000 OLED Parameter Test System

All-in-one OLED/Display Cell Characterization, Compact and Omnibus

M3000 OLED Parameter Test System consisting of McScience’s brand-new LUMO Imaging SpectroRadiometer and OLED Parameter Tester, the technical combination of which analyzes the electrical & optical properties such as I-V-L, Viewing Angle, Color Coordinates, Spectrum, Luminance Imaging and Uniformity. This equipment designed for a high-precision and high-accuracy measurement is suitable for various researches associated with display performance and characterization for OLED, QLED, Micro and Mini LED.

#OLED #I-V-L #View Angle #Lifetime # Spectrum # Luminance #Color #Image #Uniformity

OLED & Display | Solar Cell & Photovoltaics | Battery & Electrochemical System | Flexible Electronics & Organic Semiconductor | LED & Optical System

B-1102, Digital Empire Bldg. 1556-16 Deogyeong Blvd., Yeongtong, Suwon, 16690, Korea

(T) +82-31-303-5789 (F) +82-31-303-5787 (E) sales@mcscience.com (H) www.mcscience.com