TOF Measurement System

The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.

Charge Carrier Transport in Organic Semiconductor

Measurement of Electron/Hole Mobility

Time of Flight Measurement (TOF)

Dark Injection Transient (DIT)

Charge Extraction by Linearly Increasing Voltage (CELIV)

Low Temperature Measurement

System Specification



Model Name

T3000 TOF Measurement System

System Option

S : Standard Option / T : Low Temperature Option / C : Dark Injection & CELIV Function Option

System Configuration

Laser, Oscilloscope, High Voltage Sourcemeter, Signal Amplifier, Loader & Trigger Unit,

Optical Unit(Focusing Lens, Beam Splitter, Photodetector, Sample Mounting Unit,

Dark Box & System Frame, (Option) Dye Laser, Probe Unit,

Low Temperature Unit(Cryostat, Temperature Controller, Vacuum Accessories)


Size(mm) : 2,400 x 800 x 1,600 / Weight(kg) : <200kg / Utility : 220V, 15A, 99.999% N2 Gas


Organic Materials (Electron, Hole)

Sample Size / Type

Glass Size : <50mm x 50mm / Active Area : >2mm x 2mm / Top and Bottom Type

Beam Size

<2mm x 2mm

Measure Time Range

4nsec ~ 10s/div

Transit Time Min. Measure Time

Min. 1usec

Mobility Measure Range

10-6 cm2/V.sec @ 1um Sample Thickness

Measure/Analysis Item

Transit Time, Mobility, Zero Mobility, E-Field vs Mobility, Temperature vs Mobility

System Specification

System Configuration

  • Tech Icon
  • Leaflet
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T3000 TOF Measurement System

Leaflet Download (2.87MB)

System Components

N2 Laser

Trigger Unit



Function Generator


Optical Unit

JIG & Holder

T730 TOF Measurement Software