T3000
TOF Measurement System
The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.
System Specification
Classification
Content
Model Name
T3000 TOF Measurement System
System Option
S : Standard Option / T : Low Temperature Option / C : Dark Injection & CELIV Function Option
System Configuration
Laser, Oscilloscope, High Voltage Sourcemeter, Signal Amplifier, Loader & Trigger Unit,
Optical Unit(Focusing Lens, Beam Splitter, Photodetector, Sample Mounting Unit,
Dark Box & System Frame, (Option) Dye Laser, Probe Unit,
Low Temperature Unit(Cryostat, Temperature Controller, Vacuum Accessories)
Dimension
Size(mm) : 2,400 x 800 x 1,600 / Weight(kg) : <200kg / Utility : 220V, 15A, 99.999% N2 Gas
Sample
Organic Materials (Electron, Hole)
Sample Size / Type
Glass Size : <50mm x 50mm / Active Area : >2mm x 2mm / Top and Bottom Type
Beam Size
<2mm x 2mm
Measure Time Range
4nsec ~ 10s/div
Transit Time Min. Measure Time
Min. 1usec
Mobility Measure Range
10-6 cm2/V.sec @ 1um Sample Thickness
Measure/Analysis Item
Transit Time, Mobility, Zero Mobility, E-Field vs Mobility, Temperature vs Mobility
System Specification
System Configuration
T3000 TOF Measurement System
Leaflet Download (2.87MB)
System Components
N2 Laser
Trigger Unit
Oscilloscope
V-Source
Function Generator
Cryostat
Optical Unit
JIG & Holder
T730 TOF Measurement Software