T3000 PLUS

Time Delayed Collection Field Test System


T3000 PLUS Time Delayed Collection Field Test System is literally the setup used for TDCF experiment. In order to measure the transient current of sample at the time scale of nanoseconds, high-performance pulse laser and high-speed pulse generator are configured. The system allows users to exhibit dynamic characteristics of optoelectronic device and extracts the parameters of the charge carrier creation, extraction and recombination via bias control experiments, different nano scale delays and various pulse wavelength.

Time Delayed Collection Filed Test System (TDCF)

Time of Flight (TOF)

Transient Electroluminescence (T-EL)

Transient Photoluminescence (T-PL)


System Specification

Classification

Content

Model Name

T3000 PLUS Time Delayed Collection Field Test System

System Configuration

Main Frame, Pulsed Laser, Oscilloscope, Pulse Generator, T104 OSC Parameter Tester, Optostation, Signal Amplifier, Cables, Software, PC

Dimension / Weight / Electricity

Dimension : (W)2,500 mm X (D)1,000 mm X (H)2,000 mm / Weight(kg) : 100kg / Utility : 220V, 15A, 3 Port

Pulsed Laser

Type

Energy (mJ)

Pulse Width (nsec)

Beam Diameter (mm)

Nd-YAG Laser

100 @ 355nm / 300mJ @ 532nm / 650mJ @ 1064nm

4-6 @ 355nm / 4-6 @ 532nm / 4-7 @ 1065nm

7

Oscilloscope

Bandwidth

Sampling Rate

Memory Depth

600MHz

5GS/s

20Mpts @ 4ch

Pulse Generator

Frequency Range

Transition Time

Voltage Range

1uHz to 50MHz

2.5ns to 1000s

±10V into 50ohm

Option

OPO Laser, Low Temperature Function

System Specification

System Configuration

  • Tech Icon
  • Leaflet
Tech Icon
Leaflet

T3000 PLUS Time Delayed Collection Field Test System

Leaflet Download (2.89MB)

System Components

Pulse Laser System

Oscilloscope

V-Source

OSC Parameter Tester

TDCF Test Software

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