T3000 PLUS
Time Delayed Collection Field Test System
T3000 PLUS Time Delayed Collection Field Test System is literally the setup used for TDCF experiment. In order to measure the transient current of sample at the time scale of nanoseconds, high-performance pulse laser and high-speed pulse generator are configured. The system allows users to exhibit dynamic characteristics of optoelectronic device and extracts the parameters of the charge carrier creation, extraction and recombination via bias control experiments, different nano scale delays and various pulse wavelength.
System Specification
Classification
Content
Model Name
T3000 PLUS Time Delayed Collection Field Test System
System Configuration
Main Frame, Pulsed Laser, Oscilloscope, Pulse Generator, T104 OSC Parameter Tester, Optostation, Signal Amplifier, Cables, Software, PC
Dimension / Weight / Electricity
Dimension : (W)2,500 mm X (D)1,000 mm X (H)2,000 mm / Weight(kg) : 100kg / Utility : 220V, 15A, 3 Port
Pulsed Laser
Type
Energy (mJ)
Pulse Width (nsec)
Beam Diameter (mm)
Nd-YAG Laser
4-6 @ 355nm / 4-6 @ 532nm / 4-7 @ 1065nm
7
Oscilloscope
Bandwidth
Sampling Rate
Memory Depth
600MHz
5GS/s
20Mpts @ 4ch
Pulse Generator
Frequency Range
Transition Time
Voltage Range
1uHz to 50MHz
2.5ns to 1000s
±10V into 50ohm
Option
OPO Laser, Low Temperature Function
System Specification
System Configuration
T3000 PLUS Time Delayed Collection Field Test System
Leaflet Download (2.89MB)
System Components
Pulse Laser System
Oscilloscope
V-Source
OSC Parameter Tester
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