M6200
OLED Transient EL/PL Test System
High Accuracy and Enhanced Performance for Transient Response Measurement of OLED.
M6200 OLED Transient EL/PL Test System is designed to measure transient response characteristics of OLED device such as transient electroluminescence, time resolved photoluminescence. As excitation source, transient EL test system uses the electrical pulse generator, while time resolved PL test system uses the high speed pulse laser. It is useful tool to study charge carrier dynamics such as charge mobility, response time and carrier lifetime.
Transient Electroluminescence
Time Resolved Photoluminescence
Low Temperature Measurement
Spectroscopy Measurement
System Specification
Classification
Content
Product Name
M6200 OLED Transient EL/PL Test System
Function
Transient Electroluminescence Measurement (T-EL Option)
Time Resolved Photoluminescence Measurement (T-PL Option)
Pulse Generator
(for T-EL)
Frequency
Amplitude / DC Offset
Trigger
1uHz ~ 10MHz
1mVpp to 10Vpp into 50ohm / ±5V into 50ohm
Single / Continuous / Burst Mode
Laser
(for T-PL)
Type
Wavelength
Energy
Pulse Duration
Nd:Yag Pulse Laser
355nm, 532nm, 1064nm
8mJ@355nm, 25mJ@532nm, 50mJ@1064nm
3-5ns @ 355nm, 3-5ns @ 532nm, 5-7ns @ 1064nm
Oscilloscope
Oscilloscope Bandwidth
Oscilloscope Sampling Rate
500MHz
5GSa/s
Light Detector
Photo Multiplier Tube with 1nsec Rise Time
I-V Converter
50ohm Load Resistor or Preamplifier with 200MHz Bandwidth and 1.8ns Rise Time
Temperature Option
Cryostat System using Liquid Nitrogen (Temperature Range : 85K ~ 475K)
System Specification
System Configuration
< Transient PL >
< Transient EL >
M6200 OLED Transient EL/PL Test System
Leaflet Download (2.84MB)
System Components
or Time Resolved PL
for Transient EL
Oscilloscope
Monochromator
ICCD
Photo Multiplier Tube
OLED Transient EL Software