M6200

OLED Transient EL/PL Test System


High Accuracy and Enhanced Performance for Transient Response Measurement of OLED.

M6200 OLED Transient EL/PL Test System is designed to measure transient response characteristics of OLED device such as transient electroluminescence, time resolved photoluminescence. As excitation source, transient EL test system uses the electrical pulse generator, while time resolved PL test system uses the high speed pulse laser. It is useful tool to study charge carrier dynamics such as charge mobility, response time and carrier lifetime.

Transient Electroluminescence

Time Resolved Photoluminescence

Low Temperature Measurement

Spectroscopy Measurement


System Specification

Classification

Content

Product Name

M6200 OLED Transient EL/PL Test System

Function

Transient Electroluminescence Measurement (T-EL Option)

Time Resolved Photoluminescence Measurement (T-PL Option)

Pulse Generator

(for T-EL)

Frequency

Amplitude / DC Offset

Trigger

1uHz ~ 10MHz

1mVpp to 10Vpp into 50ohm / ±5V into 50ohm

Single / Continuous / Burst Mode

Laser

(for T-PL)

Type

Wavelength

Energy

Pulse Duration

Nd:Yag Pulse Laser

355nm, 532nm, 1064nm

8mJ@355nm, 25mJ@532nm, 50mJ@1064nm

3-5ns @ 355nm, 3-5ns @ 532nm, 5-7ns @ 1064nm

Oscilloscope

Oscilloscope Bandwidth

Oscilloscope Sampling Rate

500MHz

5GSa/s

Light Detector

Photo Multiplier Tube with 1nsec Rise Time

I-V Converter

50ohm Load Resistor or Preamplifier with 200MHz Bandwidth and 1.8ns Rise Time

Temperature Option

Cryostat System using Liquid Nitrogen (Temperature Range : 85K ~ 475K)

System Specification

System Configuration

< Transient PL >

< Transient EL >

  • Tech Icon
  • Leaflet
Tech Icon
Leaflet

M6200 OLED Transient EL/PL Test System

Leaflet Download (2.84MB)

System Components

or Time Resolved PL

for Transient EL

Oscilloscope

Monochromator

ICCD

Photo Multiplier Tube

OLED Transient EL Software