M6000 PLUS
OLED Lifetime Test System
All Optimized for Multi-channel Power Driving Lighting and Measurement of OLED Lifetime.
M6000 PLUS OLED Lifetime Test System is used to test the capability of OLED materials to withstand the continuous electrical source or environmental changes between high/low temperature, and therefore understands the chemical changes or physical damages caused by degradation in the designated time. It is applicable to OLED unit cell, module, panel. The lifetime test result can be used as a reference or basis for OLED material improvement and better quality.
Relative/Absolute Lifetime Test
Relative/Absolute I-V-L Test
Aging Test
Multi Current/Photocurrent Range
Sequence Operation with mutiple Recipe
Acceleration Test using Thermal Chamber
System Specification
Classification
Content
Product Name
M6000 PLUS OLED Lifetime Test System
Function
Lifetime Test, Aging Test, IV Scan during Lifetime Test
Capacity
32ch / Unit
Output Mode
CV, CC, CL, PV, PC, PCV
Voltage
Range
Accuracy
±20V
±0.05% + 10mV (F.S.R.)
Current
Range
Accuracy
[Range 1] ±1mA / [Range 2] ±10mA (Auto 2-Range Shunt Type)
[Range 1] ±0.05% + 1uA (F.S.R.) / [Range 2] ±0.05% + 10uA (F.S.R.)
Photocurrent
Range
Accuracy
[Range 1] 0uA~10uA / [Range 2] 0uA~100uA / [Range 3] 0uA~1mA (Auto)
[Range 1] ±0.05% + 5nA (F.S.R.) / [Range 2] ±0.05% + 10nA (F.S.R.) / [Range 3] ±0.05% + 50nA (F.S.R.)
Pulse
Frequency Range
Duty
10 ~ 256Hz / 1Hz Step
1 ~ 99% / 1% Step
Measurement Item
Time, Voltage, Current, Photo-Current, Luminance, CIE
Data Backup
Automatic Data Backup in HW Memory in case of SW Disconnection
Interface
LAN
System Specification
System Configuration
M6000 PLUS OLED Lifetime Test System
Leaflet Download (3.15MB)
System Components
OLED Lifetime Tester
Test Jig
JIG Frame
ThermoStation
Chamber
UPS
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