M6000 PLUS

OLED Lifetime Test System


All Optimized for Multi-channel Power Driving Lighting and Measurement of OLED Lifetime.

M6000 PLUS OLED Lifetime Test System is used to test the capability of OLED materials to withstand the continuous electrical source or environmental changes between high/low temperature, and therefore understands the chemical changes or physical damages caused by degradation in the designated time. It is applicable to OLED unit cell, module, panel. The lifetime test result can be used as a reference or basis for OLED material improvement and better quality.

Relative/Absolute Lifetime Test

Relative/Absolute I-V-L Test

Aging Test

Multi Current/Photocurrent Range

Sequence Operation with mutiple Recipe

Acceleration Test using Thermal Chamber


System Specification

Classification

Content

Product Name

M6000 PLUS OLED Lifetime Test System

Function

Lifetime Test, Aging Test, IV Scan during Lifetime Test

Capacity

32ch / Unit

Output Mode

CV, CC, CL, PV, PC, PCV

Voltage

Range

Accuracy

±20V

±0.05% + 10mV (F.S.R.)

Current

Range

Accuracy

[Range 1] ±1mA / [Range 2] ±10mA (Auto 2-Range Shunt Type)

[Range 1] ±0.05% + 1uA (F.S.R.) / [Range 2] ±0.05% + 10uA (F.S.R.)

Photocurrent

Range

Accuracy

[Range 1] 0uA~10uA / [Range 2] 0uA~100uA / [Range 3] 0uA~1mA (Auto)

[Range 1] ±0.05% + 5nA (F.S.R.) / [Range 2] ±0.05% + 10nA (F.S.R.) / [Range 3] ±0.05% + 50nA (F.S.R.)

Pulse

Frequency Range

Duty

10 ~ 256Hz / 1Hz Step

1 ~ 99% / 1% Step

Measurement Item

Time, Voltage, Current, Photo-Current, Luminance, CIE

Data Backup

Automatic Data Backup in HW Memory in case of SW Disconnection

Interface

LAN

System Specification

System Configuration

  • Tech Icon
  • Leaflet
Tech Icon
Leaflet

M6000 PLUS OLED Lifetime Test System

Leaflet Download (3.15MB)

System Components

OLED Lifetime Tester

Test Jig

JIG Frame

ThermoStation

Chamber

UPS

OLED Lifetime Test Software

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