M6000
OLED Lifetime Test System
All Optimized for Multi-channel Power Driving, Lighting, and Measurement of OLED Lifetime
The M6000 OLED Lifetime Test System provides multi-channel testing frame in which power driving for OLED lighting is possible in various control mode, and emitted light intensity and color information can be collected by each photodiode combined to each OLED test sample. Depending on the type of photodiode employed, the measure could be an absolute luminance, or a CIE color index, or just a photocurrent value from the photodiode. The system has three sub-models based on power driving methods, PMX for unit cell device and PMOLED panel, AMX for AMOLED panel, and MDX for OLED module with driver IC.
Multi-Channel Lifetime Test Using Photo-Diode
Unit Cell / Panel / Module
DC / Pulse / Pattern CC / CV / CL / PCV / PC / PV
Temperature / Humidity Control
Compact Test Jig
System Specification
classification
Content
Product Model
M6000 OLED Lifetime Test System
Standard Model
PMX: Unit Cell / AMX: Panel / MDX: Module
System Configuration
Lifetime Tester, JIG and Frame(Drawer Type), Lifetime Test Software, Temperature/Humidity Chamber
Channel
4 Channel / 32 Channel / 96 Channel
Channel expandable
Source
Mode
Constant
Pulse
Accuracy
Constance Voltage / Current, Pulse Voltage / Current, Pulse Current / Voltage
Voltage: ±20V / Current: Max. ±100mA (User Selectable)
Frequency: 1Hz ~ 256Hz / Duty: 1 ~ 99%
±0.1% of Full Scale
Photo Current Measurement
0 ~ 100uA
Environment Chamber
Temperature
Humidity
R.T ~ 100℃
10 ~ 90%
User Selectable
Measurement
Time, Voltage, Current, Photo Current, Relative Luminance
Operating Condition
Temperature : 23°C ± 5°C, Humidity : 20 ~ 80% RH(Non-Condensation)
PC Interface
TCP/IP(LAN), RS-232(Serial)
System Specification
System Configuration
M6000 OLED Lifetime Test System
Leaflet Download (3.18MB)
System Components
OLED Lifetime Tester M600
OLED Lifetime Tester M600
Test Jig
Jig Frame
ThermoStation
Chamber
UPS
M760 OLED Lifetime Test Software