K3300
Solar Cell Imaging Test System
Solar Cell Inspection Tool Using Luminescence Imaging and Laser Scanning
This system provides various imaging test solutions such as electroluminescence, photoluminescence, thermal imaging, and light beam induced current measurement for inspection of solar cell’s internal defects and device failures.
Electroluminescence Imaging
Photoluminescence Imaging
Light Beam Induced Current Imaging
Thermal Imaging
Automatic Detection of Microcrack, Dark Area & Finger Defect
Defects of solar cell and module, such as crack, dark area and finger defect are detected from luminescence inspection.
System Specification
Classification
Content
Model Name
K3300 Solar Cell Imaging Test System
System Model
ELX : EL Measurement / PLX : PL Measurement / EPLI : EL+PL / EPLB : EL+PL+ LBIC Measurement
System Configuration
K301 Camera Set, [K103 ELX DC Power Supply : Using ELX], [K310 LD Driver, LED, LASER : Using PLX],
Main frame, Box Table [Motion : Using Semi Auto ELX], Controller, PC, ACC
Measure Time
EL : <10sec, PL : <10sec, LBIC : 2 hour (6” Cell)
Measurement
Mircro Crack, Hot Spot, Finger Defect, Dark Area, Isc Mapping, Relative Efficiency
Dimension
ELX & PLX – [Size : (W)600mm x (d)1,000mm x (H)1,800mm / Weight : <100Kg / Utility : 200V, 15A, Air 6 Bar]
EPLI & EPLB – [Size : (W)1,200mm x (d)1,000mm x (H)1,800mm / Weight : <300Kg / Utility : 200V, 15A, Air 6 Bar]
Test Sample
Crystaline 5”, 6”, Si Solar Cell
System Specification
System Configuration
K3500 Solar Cell Imaging Test System
Leaflet Download (2.58MB)
System Components
K301 Imaging Kit
K103 ELX Powermeter
K310 LD Driver
LED 850
Laser
PLC
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