M760 PLUS
OLED Lifetime Test Software
Software Specification
Funtion
Description
Measurement Function
Lifetime Measurement
IVL Measurement (L: Photo Diode Current)
Aging Measurement
Bias Mode: CV,CC,PV,PC,PCV
Data Monitoring Function
Test Data Append
Test Data Save Interval Setting
Test End Condition Setting
Test Sequence
Test Result Parameters
Time(hrs), Voltage, Current, High Voltage, High Current, PhotoDiode Current, Relative Luminance , Temperature(Option)
Report Type
CSV File Format
Graph Viewer
User Preference Graph Curve Display
Multi Graph / Single Graph
Realtime Graph Plot
Options
Data Unit & Digit Change
Status Color Change
Report Format Change
Temperature Control & Monitoring
Realtime Temperature Monitoring (Option)
Operation SW
MicroSoft Window XP/ Window 7 / Window 10
Support Device
(Source Meter)
Mcscience M600PLUS
Support Device
(Temperature Controller)
Mcscience Temperature Controller (NX1, TTM004, TEMP Series)
Software Specification
