M760 PLUS

OLED Lifetime Test Software



Software Specification

Funtion

Description

Measurement Function

Lifetime Measurement

IVL Measurement (L: Photo Diode Current)

Aging Measurement

Bias Mode: CV,CC,PV,PC,PCV

Data Monitoring Function

Test Data Append

Test Data Save Interval Setting

Test End Condition Setting

Test Sequence

Test Result Parameters

Time(hrs), Voltage, Current, High Voltage, High Current, PhotoDiode Current, Relative Luminance , Temperature(Option)

Report Type

CSV File Format

Graph Viewer

User Preference Graph Curve Display

Multi Graph / Single Graph

Realtime Graph Plot

Options

Data Unit & Digit Change

Status Color Change

Report Format Change

Temperature Control & Monitoring

Realtime Temperature Monitoring (Option)

Operation SW

MicroSoft Window XP/ Window 7 / Window 10

Support Device

(Source Meter)

Mcscience M600PLUS

Support Device

(Temperature Controller)

Mcscience Temperature Controller (NX1, TTM004, TEMP Series)

Software Specification